Ankita Jain
Assistant Professor
ankita.jain@mahindrauniversity.edu.in
Dr. Ankita Jain is an Assistant Professor in the Electrical and Electronics Engineering Department at Mahindra École Centrale College of Engineering. She received Ph.D. in the Discipline of Electrical Engineering from Indian Institute of Technology Indore, Indore, India in 2019. Prior to joining MU, she worked for Intel Microelectronics, Penang, Malaysia for a year. Her research interests are in the area of Image Processing, Biometrics, Digital Signal Processing, and Pattern Recognition.
2014-2019
Ph.D. degree in the Discipline of Electrical Engineering from Indian Institute of Technology Indore, Indore, India.
Title“Human behavior analysis using smartphone sensor data”
Supervisor: Dr. Vivek Kanhangad
2008-2010
Master of Technology degree in VLSI Design from ABV-Indian Institute of Information Technology and Management, Gwalior, India.
Title: “Reduction of subthreshold leakage power in nanometer regime: A reference to CMOS device”
2004-2008
Bachelor of Engineering in Electronics & Communication Engineering from Institute of Technology and Management, Gwalior, India
2019-2020
April 2019-February 2020: Worked as a Firmware validation engineer in Intel Microelectronics, Penang, Malaysia.
2010-2013
Worked as a Junior Scientist from Jan 2013 to Nov 2013 and as a Sr. Research Associate from May 2010 to Dec 2012 in the Research and Development department of KPIT Technologies Limited.
Journals
2019
2018
A. Jain and V. Kanhangad, “Gender classification in smartphones using gait information,” Expert Systems with Applications, vol. 93, pp. 257-266.
2015
2013
Conference Proceedings
2018
2016
2013
2012
2011
2010
Areas of interest:
- Digital Signal and Image Processing
- Biometrics
- Pattern Recognition
- Machine Learning
Professional Services:
- Organized TecXpedition 2013 (technical paper conference) at KPIT Technologies Ltd.
Reviewer of International Journals:
- IEEE Journal of Biomedical and Health Informatics
- Pattern Recognition Letters
- IEEE Sensors Journal
- IEEE Access